SCANNING ELECTRON MICROSCOPE (SEM)
It is used to take images from the sample with the help of electron beam.
Brand / Model: Zeiss / Gemini 300
Detectors : ETD ( Everhart Thornley Detector ), BSED, In- Lens SE, In- Lens BSE, EDS, Low Vacuum SE Detector
Sample Chamber Inside Diameter: 340 mm
Vacuum: High Vacuum - Low Vacuum
Electron Gun: Scottky FEG Gun
Analyzes: ceramics , metals, polymers, composites , nanomaterials samples and biological materials such as microstructure analysis can be performed.
X-RAY DIFFRACTOMETER (XRD)
It provides information about the crystal structure of the sample with the help of X-rays.
Brand / Model: Bruker / D8 Advance
X-Ray Tube: 1.88 Kw copper anode
Scan Angle Range (2Ɵ): -10o - 150o
Goniometer Diameter: 480 mm
Analyzes: powders , bulk samples and thin films phase identification, thin films reflectivity , grazing incidence , stress and texture analysis, WAX analysis and SAXS analyzes can be performed in addition.
ATOMIC FORCE MICROSCOPE (AFM)
Surface topography with the help of interactions between the needle tip and the sample surface ; three-dimensional, nano- size and high resolution.
Brand / Model: Nanosurf / Flex AFM
Working Environment: Air and liquid
Maximum Scanning Area: 100 x 100 µm
Scanning Modes : Dynamic Force, Static Force, Magnetic Force, Kelvin Probe Force, Multiple Spectroscopy Modes , Lithography, Phase Differences, Non-Contact
CONTACT ANGLE MEASURING DEVICE
It is used to measure contact angle, dynamic contact angle and surface tension values. It also provides information about 3D surface roughness with topography module .
Brand / Model: Biolin Scientific Attension Theta Flex
Contact Angle Measurement Range: 0 -180°
Contact Angle Measurement Accuracy: ± 0.1°
Surface Tension Measurement Range: 0 .01 - 2000 mN / m
Surface Tension Measurement Accuracy: ± 0.01 mN / m
Maximum Resolution: 1984 x 1264 pixels
Sample Type and Size: Pellet or thin film, unlimited x 100 × 320 mm
UPRIGHT MICROSCOPE
Fluorescent lamp allows cell scoring
Brand / Model: Carl Zeiss / Axio Scope A1
Device Features:
Fluorescent, phase & contrast , dark field and bright field observation
100W HG Fluorescent lighting lamp
5X - 100X magnification
12Volt 100Watt halogen lighting source
Komet software which allows cells scoring feature
INVERTED MICROSCOPE
The inverted microscope is suitable for metallurgical analysis and serves to display the elemental contrast of the samples.
Make / Model: Carl Zeiss / Axio Vert A1
Device Features:
Polarized light, bright and dark field observation
5X - 100X magnification
12Volt 100Watt halogen lighting source
Multiple photo merge on X and Z axes
STEREO MICROSCOPE
Allows 3D images to be captured at the same time for small objects.
Brand / Model: Carl Zeiss / Discovery V12
Device Features:
8X - 100X magnification
12Volt 100Watt halogen lighting source
Multiple photo merge on X and Z axes
SEM SAMPLE COATING DEVICE
Enables non-conductive samples to be conductive by coating to the desired thickness.
Brand / Model: Leica / ACE600
Device Features:
Gold / Palladium ( Au / Pd) or Carbon (C) coating
